Quantitative Specifications to Avoid Degradation during E-beam and Induced Current Microscopy of Halide Perovskite Devices
Luo, Yanqi, Parikh, Pritesh, Brenner, Thomas M., Kim, Min-Cheol, Wang, Rui, Yang, Yang, Correa-Baena, Juan-Pablo, Buonassisi, Tonio, Meng, Ying Shirley, Fenning, David P.Journal:
The Journal of Physical Chemistry C
DOI:
10.1021/acs.jpcc.0c06733
Date:
August, 2020
File:
PDF, 2.40 MB
2020
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