[IEEE 2020 IEEE Silicon Nanoelectronics Workshop (SNW) - Honolulu, HI, USA (2020.6.13-2020.6.14)] 2020 IEEE Silicon Nanoelectronics Workshop (SNW) - Reliability analysis of P-type SOI FinFETs with multiple SiGe channels on the degradation of NBTI
Cho, Tzuting, Liang, Renrong, Yu, Guofang, Xu, JunYear:
2020
DOI:
10.1109/SNW50361.2020.9131612
File:
PDF, 3.32 MB
2020