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[IEEE 2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW) - Seattle, WA, USA (2020.6.14-2020.6.19)] 2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW) - C-SURE: Shrinkage Estimator and Prototype Classifier for Complex-Valued Deep Learning
Chakraborty, Rudrasis, Xing, Yifei, Duan, Minxuan, Yu, Stella X.Year:
2020
DOI:
10.1109/CVPRW50498.2020.00048
File:
PDF, 436 KB
2020