Nanoscale stereometric evaluation of BiZn0.5Ti0.5O3 thin films grown by Rf magnetron sputtering
Barcelay, Yonny Romaguera, Moreira, Joaquim Agostinho Gomes, de Jesus Monteiro Almeida, Abilio, Brito, Walter Ricardo, Matos, Robert Saraiva, da Fonseca Filho, Henrique DuarteJournal:
Materials Letters
DOI:
10.1016/j.matlet.2020.128477
Date:
August, 2020
File:
PDF, 3.40 MB
2020
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