[IEEE 2020 IEEE/CVF Conference on Computer Vision and...

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[IEEE 2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW) - Seattle, WA, USA (2020.6.14-2020.6.19)] 2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW) - CLEval: Character-Level Evaluation for Text Detection and Recognition Tasks

Baek, Youngmin, Nam, Daehyun, Park, Sungrae, Lee, Junyeop, Shin, Seung, Baek, Jeonghun, Lee, Chae Young, Lee, Hwalsuk
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Year:
2020
DOI:
10.1109/CVPRW50498.2020.00290
File:
PDF, 1.63 MB
2020
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