[IEEE 2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW) - Seattle, WA, USA (2020.6.14-2020.6.19)] 2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW) - CLEval: Character-Level Evaluation for Text Detection and Recognition Tasks
Baek, Youngmin, Nam, Daehyun, Park, Sungrae, Lee, Junyeop, Shin, Seung, Baek, Jeonghun, Lee, Chae Young, Lee, HwalsukYear:
2020
DOI:
10.1109/CVPRW50498.2020.00290
File:
PDF, 1.63 MB
2020