[IEEE 2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW) - Seattle, WA, USA (2020.6.14-2020.6.19)] 2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW) - Deepfakes Detection with Automatic Face Weighting
Montserrat, Daniel Mas, Hao, Hanxiang, Yarlagadda, S. K., Baireddy, Sriram, Shao, Ruiting, Horvath, Janos, Bartusiak, Emily, Yang, Justin, Guera, David, Zhu, Fengqing, Delp, Edward J.Year:
2020
DOI:
10.1109/CVPRW50498.2020.00342
File:
PDF, 449 KB
2020