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[IEEE 2020 IEEE 70th Electronic Components and Technology Conference (ECTC) - Orlando, FL, USA (2020.6.3-2020.6.30)] 2020 IEEE 70th Electronic Components and Technology Conference (ECTC) - Reliability Assessment of mmWave Modules
Wambera, Laura, Meier, Karsten, Bock, Karlheinz, Gotze, Christian, Wieland, MarcelYear:
2020
DOI:
10.1109/ECTC32862.2020.00125
File:
PDF, 971 KB
2020