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IEEE Transactions on Reliability 2020

Remaining Useful Life Prediction Based on Normalizing Flow Embedded Sequence-to-Sequence Learning

Yang, Haosen, Ding, Keqin, Qiu, Robert C., Mi, Tiebin
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Year:
2020
Journal:
IEEE Transactions on Reliability
DOI:
10.1109/TR.2020.3010970
File:
PDF, 2.40 MB
2020
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