Life-time Degradation of STT-MRAM by Self-Heating Effect...

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Solid-State Electronics 2020 / 8

Life-time Degradation of STT-MRAM by Self-Heating Effect with TDDB Model

Zhang, Xue, Zhang, Guangjun, Shen, Lijie, Yu, Pingping, Jiang, Yanfeng
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Journal:
Solid-State Electronics
DOI:
10.1016/j.sse.2020.107878
Date:
August, 2020
File:
PDF, 3.96 MB
2020
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