![](/img/cover-not-exists.png)
[IEEE 2020 18th IEEE International New Circuits and Systems Conference (NEWCAS) - Montréal, QC, Canada (2020.6.16-2020.6.19)] 2020 18th IEEE International New Circuits and Systems Conference (NEWCAS) - Detecting tampered regions in JPEG images via CNN
Taya, Kunihiko, Kuroki, Nobutaka, Takeda, Naoto, Hirose, Tetsuya, Numa, MasahiroYear:
2020
DOI:
10.1109/NEWCAS49341.2020.9159761
File:
PDF, 2.07 MB
2020