[IEEE 2020 Annual Reliability and Maintainability Symposium (RAMS) - Palm Springs, CA, USA (2020.1.27-2020.1.30)] 2020 Annual Reliability and Maintainability Symposium (RAMS) - A Novel Parameter-Related Wiener Process Model With Its Estimation of Remaining Useful Life in Degradation Analysis
Yan, Bingxin, Ma, XiaobingYear:
2020
DOI:
10.1109/RAMS48030.2020.9153665
File:
PDF, 347 KB
2020