From Wafers to Bits and Back again: Using Deep Learning to Accelerate the Development and Characterization of SiC
Leonard, Robert, Conrad, Matthew, Van Brunt, Edward, Giles, Jeffrey, Hutchins, Ed, Balkas, ElifVolume:
1004
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.1004.321
Date:
July, 2020
File:
PDF, 1.13 MB
2020