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Impact of High-k Gate Dielectric on Self-Heating Effects in PiFETs Structure
Belkhiria, Maissa, Echouchene, Fraj, Jaba, Nejeh, Bajahzar, Abdullah, Belmabrouk, HafedhYear:
2020
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2020.3012418
File:
PDF, 1.91 MB
2020