Review and Detail Classification of Stacking Faults in...

Materials Science Forum 2020 / 7 Vol. 1004

Review and Detail Classification of Stacking Faults in 4H-SiC Epitaxial Layer by Mirror Projection Electron Microscopy

Ohira, Kentaro, Isshiki, Toshiyuki, Sako, Hideki, Hasegawa, Masaki, Kobayashi, Kenji, Onuki, Katsunori
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
1004
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.1004.314
Date:
July, 2020
File:
PDF, 1.97 MB
2020
Conversion to is in progress
Conversion to is failed