Dual defects and build-in electric field mediated direct...

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Journal of Colloid and Interface Science 2020 / 8

Dual defects and build-in electric field mediated direct Z-scheme W18O49/g-C3N4-x heterojunction for photocatalytic NO removal and organic pollutant degradation

Wang, Min, Tan, Guoqiang, Dang, Mingyue, Wang, Yong, Zhang, Bixin, Ren, Huijun, Lv, Long, Xia, Ao
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Journal:
Journal of Colloid and Interface Science
DOI:
10.1016/j.jcis.2020.08.040
Date:
August, 2020
File:
PDF, 7.89 MB
2020
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