Reliability Modeling for Metallized Film Capacitors Based...

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IEEE Journal of Emerging and Selected Topics in Power Electronics 2020

Reliability Modeling for Metallized Film Capacitors Based on Time-Varying Stress Mission Profile and Aging of ESR

Lv, Chunlin, Liu, Jinjun, Zhang, Yan, Lei, Wanjun, Cao, Rui, Lv, Gaotai
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Year:
2020
Journal:
IEEE Journal of Emerging and Selected Topics in Power Electronics
DOI:
10.1109/JESTPE.2020.3001604
File:
PDF, 1.08 MB
2020
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