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[IEEE 2020 IEEE International Reliability Physics Symposium (IRPS) - Dallas, TX, USA (2020.4.28-2020.5.30)] 2020 IEEE International Reliability Physics Symposium (IRPS) - Effect of Residual TiN on Reliability of Au Wire Bonds during High Temperature Storage

McGlone, J. M., Brizar, G., Vanderstraeten, D., Iyer, D., Hose, S., Gambino, J.P.
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Year:
2020
DOI:
10.1109/irps45951.2020.9128891
File:
PDF, 1018 KB
2020
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