Reconstruction of time series leaf area index for improving...

Computers and Electronics in Agriculture 2020 / 10 Vol. 177

Reconstruction of time series leaf area index for improving wheat yield estimates at field scales by fusion of Sentinel-2, -3 and MODIS imagery

Zhou, Xijia, Wang, Pengxin, Tansey, Kevin, Zhang, Shuyu, Li, Hongmei, Tian, Huiren
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Volume:
177
Journal:
Computers and Electronics in Agriculture
DOI:
10.1016/j.compag.2020.105692
Date:
October, 2020
File:
PDF, 4.77 MB
2020
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