Extending XPS Surface Analysis with Correlative...

Microscopy and Microanalysis 2020 / 07

Extending XPS Surface Analysis with Correlative Spectroscopy and Microscopy

Nunney, Tim, Mack, Paul, Simpson, Robin, Passey, Rick, Oppong-Mensah, Helen, Baker, Mark
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Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927620016670
Date:
July, 2020
File:
PDF, 194 KB
2020
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