Vision-Based Fault Diagnostics Using Explainable Deep...

IEEE Access 2020 Vol. 8

Vision-Based Fault Diagnostics Using Explainable Deep Learning With Class Activation Maps

Sun, Kyung Ho, Huh, Hyunsuk, Tama, Bayu Adhi, Lee, Soo Young, Jung, Joon Ha, Lee, Seungchul
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Volume:
8
Year:
2020
Journal:
IEEE Access
DOI:
10.1109/ACCESS.2020.3009852
File:
PDF, 2.09 MB
2020
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