[IEEE 2020 IEEE/CVF Conference on Computer Vision and...

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[IEEE 2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR) - Seattle, WA, USA (2020.6.13-2020.6.19)] 2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR) - Event Probability Mask (EPM) and Event Denoising Convolutional Neural Network (EDnCNN) for Neuromorphic Cameras

Baldwin, R. Wes, Almatrafi, Mohammed, Asari, Vijayan, Hirakawa, Keigo
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Year:
2020
DOI:
10.1109/CVPR42600.2020.00177
File:
PDF, 2.98 MB
2020
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