PRESERVE: Static Test Compaction that Preserves Individual...

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IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 2020

PRESERVE: Static Test Compaction that Preserves Individual Numbers of Tests

Pomeranz, Irith
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Year:
2020
Journal:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
DOI:
10.1109/TCAD.2020.3005371
File:
PDF, 125 KB
2020
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