Characterization and Modeling of Current Transport in...

  • Main
  • 2020
  • Characterization and Modeling of Current Transport in...
IEEE Transactions on Electron Devices 2020

Characterization and Modeling of Current Transport in Metal/Ferroelectric/Semiconductor Tunnel Junctions

Franchini, Giulio, Spinelli, Alessandro S., Nicosia, Gianluca, Fumagalli, Ivan, Asa, Marco, Groppi, Chiara, Rinaldi, Christian, Lacaita, Andrea L., Bertacco, Riccardo, Compagnoni, Christian Monzio
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2020
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2020.3011398
File:
PDF, 1.26 MB
2020
Conversion to is in progress
Conversion to is failed