[IEEE 2020 IEEE European Test Symposium (ETS) - Tallinn,...

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[IEEE 2020 IEEE European Test Symposium (ETS) - Tallinn, Estonia (2020.5.25-2020.5.29)] 2020 IEEE European Test Symposium (ETS) - Avoiding Mixed-Signal Field Returns by Outlier Detection of Hard-to-Detect Defects based on Multivariate Statistics

Xama, Nektar, Raymaekers, Jakob, Andraud, Martin, Gomez, Jhon, Dobbelaere, Wim, Vanhooren, Ronny, Coyette, Anthony, Gielen, Georges
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Year:
2020
DOI:
10.1109/ets48528.2020.9131602
File:
PDF, 689 KB
2020
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