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[IEEE 2020 IEEE Symposium on VLSI Circuits - Honolulu, HI, USA (2020.6.16-2020.6.19)] 2020 IEEE Symposium on VLSI Circuits - A 65nm 16kb SRAM with 131.5pW Leakage at 0.9V for Wireless IoT Sensor Nodes
Gupta, Shourya, Truesdell, Daniel S., Calhoun, Benton H.Year:
2020
DOI:
10.1109/VLSICircuits18222.2020.9162772
File:
PDF, 958 KB
2020