[IEEE 2020 IEEE International Symposium on Medical Measurements and Applications (MeMeA) - Bari, Italy (2020.6.1-2020.7.1)] 2020 IEEE International Symposium on Medical Measurements and Applications (MeMeA) - Deep Melanoma classification with K-Fold Cross-Validation for Process optimization
Nie, Yali, De Santis, Laura, Carratu, Marco, O'Nils, Mattias, Sommella, Paolo, Lundgren, JanYear:
2020
DOI:
10.1109/memea49120.2020.9137222
File:
PDF, 1.46 MB
2020