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Injection and Retention Characterization of Trapped Charges in Electret Films by Electrostatic Force Microscopy and Kelvin Probe Force Microscopy
Wang, Jin, Zhang, He, Cao, Guo-sheng, Xie, Ling-hai, Huang, WeiJournal:
physica status solidi (a)
DOI:
10.1002/pssa.202000190
Date:
August, 2020
File:
PDF, 583 KB
2020