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Effect of electron beam evaporation process parameters on infrared refractive index of Ge film
Li, Kun, Xiong, Yu-qing, Wang, Hu, Zhang, Kai-feng, Xu, Ling-mao, Li, Xue-lei, Zhou, HuiVolume:
16
Journal:
Optoelectronics Letters
DOI:
10.1007/s11801-020-9152-8
Date:
July, 2020
File:
PDF, 1.68 MB
2020