More accurate parameterization of positron implantation depth profiles for the sensitivity range of positron-based characterization techniques
Logan, J. V., Short, M. P., Webster, P. T., Morath, C. P.Volume:
128
Journal:
Journal of Applied Physics
DOI:
10.1063/5.0011021
Date:
July, 2020
File:
PDF, 4.63 MB
2020