Advances in electron channelling contrast imaging and...

IOP Conference Series Materials Science and Engineering 2020 / 08 Vol. 891

Advances in electron channelling contrast imaging and electron backscatter diffraction for imaging and analysis of structural defects in the scanning electron microscope

Trager-Cowan, C, Alasmari, A, Avis, W, Bruckbauer, J, Edwards, P R, Hourahine, B, Kraeusel, S, Kusch, G, Jablon, B M, Johnston, R, Martin, R W, Mcdermott, R, Naresh-Kumar, G, Nouf-Allehiani, M, Pascal
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Volume:
891
Journal:
IOP Conference Series: Materials Science and Engineering
DOI:
10.1088/1757-899X/891/1/012023
Date:
August, 2020
File:
PDF, 2.52 MB
2020
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