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[IEEE 2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR) - Seattle, WA, USA (2020.6.13-2020.6.19)] 2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR) - Attention-Driven Cropping for Very High Resolution Facial Landmark Detection
Chandran, Prashanth, Bradley, Derek, Gross, Markus, Beeler, ThaboYear:
2020
DOI:
10.1109/CVPR42600.2020.00590
File:
PDF, 1.92 MB
2020