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An Electrical Model for Trap Coupling Effects on Random Telegraph Noise
Becker, Thales, Li, Xuehua, Alves, Pedro, Wang, Tao, Zhu, Kaichen, Xiao, Yiping, Wirth, Gilson, Lanza, MarioYear:
2020
Journal:
IEEE Electron Device Letters
DOI:
10.1109/LED.2020.3015842
File:
PDF, 892 KB
2020