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[IEEE 2020 36th Semiconductor Thermal Measurement, Modeling & Management Symposium (SEMI-THERM) - San Jose, CA, USA (2020.3.16-2020.3.20)] 2020 36th Semiconductor Thermal Measurement, Modeling & Management Symposium (SEMI-THERM) - Thermal Characterization of a Virtual Reality Headset during Transient and Resting Operation
McAfee, Rachel, Haxton, Cole, Harrison, Matthew, Gess, JoshuaYear:
2020
DOI:
10.23919/SEMI-THERM50369.2020.9142850
File:
PDF, 837 KB
2020