Probing the roughness of porphyrin thin films with X‐ray...

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ChemPhysChem 2020 / 08

Probing the roughness of porphyrin thin films with X‐ray photoelectron spectroscopy

Kataev, Elmar, Wechsler, Daniel, Williams, Federico, Köbl, Julia, Tsud, Nataliya, Franchi, Stefano, Steinrück, Hans-Peter, Lytken, Ole
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Journal:
ChemPhysChem
DOI:
10.1002/cphc.202000568
Date:
August, 2020
File:
PDF, 1.21 MB
2020
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