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Effects of strain on thermal conductivity of silicon dioxide thin films using test method based on 3-Ï technique and uniaxial strain setup
Li, Zhibin, Wang, Hairong, Zhao, Huiying, Gu, Hanqing, Wang, Jiuhong, Wei, XueyongVolume:
91
Journal:
Review of Scientific Instruments
DOI:
10.1063/5.0014083
Date:
August, 2020
File:
PDF, 4.93 MB
2020