Sensitivity Analysis Based on Neural Network for Optimizing...

  • Main
  • 2020
  • Sensitivity Analysis Based on Neural Network for Optimizing...
IEEE Electron Device Letters 2020

Sensitivity Analysis Based on Neural Network for Optimizing Device Characteristics

Oh, Min-Hye, Kwon, Min-Woo, Park, Kyungchul, Park, Byung-Gook
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2020
Journal:
IEEE Electron Device Letters
DOI:
10.1109/LED.2020.3016119
File:
PDF, 7.68 MB
2020
Conversion to is in progress
Conversion to is failed