Prediction of single event upset critical charge and...

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Radiation Effects and Defects in Solids 2020 / 08

Prediction of single event upset critical charge and sensitive volume depth by energy deposition analysis of low energy protons

Zhao, Wen, Chen, Wei, He, Chaohui, Chen, Rongmei, Wang, Liang, Wang, Zujun, Cong, Peitian, Guo, Xiaoqiang, Shen, Chen
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Journal:
Radiation Effects and Defects in Solids
DOI:
10.1080/10420150.2020.1806838
Date:
August, 2020
File:
PDF, 3.01 MB
2020
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