[IEEE 2020 IEEE International Conference on Semiconductor...

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[IEEE 2020 IEEE International Conference on Semiconductor Electronics (ICSE) - Kuala Lumpur, Malaysia (2020.7.28-2020.7.29)] 2020 IEEE International Conference on Semiconductor Electronics (ICSE) - Real time In-Situ Quality Monitoring of Grinding Process using Microtechnology based Sensor Fusion

Khazi, Isman, Kovacs, Andras, Zahedi, Ali, Reser, Christian, Mescheder, Ulrich, Azarhoushang, Bahman, Reich, Christoph
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Year:
2020
DOI:
10.1109/ICSE49846.2020.9166898
File:
PDF, 1.34 MB
2020
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