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[IEEE 2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS) - Napoli, Italy (2020.7.13-2020.7.15)] 2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS) - Temporary Laser Fault Injection into Flash Memory: Calibration, Enhanced Attacks, and Countermeasures
Garb, Kathrin, Obermaier, JohannesYear:
2020
DOI:
10.1109/IOLTS50870.2020.9159712
File:
PDF, 1.31 MB
2020