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IEEE Transactions on Semiconductor Manufacturing 2020

Support Weighted Ensemble Model for Open Set Recognition of Wafer Map Defects

Jang, Jaeyeon, Seo, Minkyung, Kim, Chang Ouk
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Year:
2020
Journal:
IEEE Transactions on Semiconductor Manufacturing
DOI:
10.1109/TSM.2020.3012183
File:
PDF, 1020 KB
2020
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