[IEEE 2020 2nd International Conference on Data, Engineering and Applications (IDEA) - Bhopal, India (2020.2.28-2020.2.29)] 2nd International Conference on Data, Engineering and Applications (IDEA) - Plant Leaf Disease Classification Using Grid Search Based SVM
Bhagat, Monu, Kumar, Dilip, Haque, Isharul, Munda, Hemant Singh, Bhagat, RaviYear:
2020
DOI:
10.1109/IDEA49133.2020.9170725
File:
PDF, 2.68 MB
2020