[IEEE 2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS) - Napoli, Italy (2020.7.13-2020.7.15)] 2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS) - Single Phase Clock Based Radiation Tolerant D Flip-flop Circuit
Jain, A., Veggetti, A., Crippa, D., Benfante, A., Gerardin, S., Bagatin, M.Year:
2020
DOI:
10.1109/IOLTS50870.2020.9159741
File:
PDF, 1.62 MB
2020