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[IEEE 2020 32nd International Symposium on Power Semiconductor Devices and ICs (ISPSD) - Vienna, Austria (2020.9.13-2020.9.18)] 2020 32nd International Symposium on Power Semiconductor Devices and ICs (ISPSD) - Improvement of Cosmic Ray Robustness in IGBT with Deep-N layer
Yoshikawa, Daiki, Hayashi, Masato, Yamashita, Hiroaki, Kawaguchi, YusukeYear:
2020
DOI:
10.1109/ISPSD46842.2020.9170029
File:
PDF, 1.83 MB
2020