Analysis of Work-Function Variation Effects in a Tunnel Field-Effect Transistor Depending on the Device Structure
Kim, Garam, Kim, Jang Hyun, Kim, Jaemin, Kim, SangwanVolume:
10
Journal:
Applied Sciences
DOI:
10.3390/app10155378
Date:
August, 2020
File:
PDF, 2.03 MB
2020