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[IEEE 2020 32nd International Symposium on Power Semiconductor Devices and ICs (ISPSD) - Vienna, Austria (2020.9.13-2020.9.18)] 2020 32nd International Symposium on Power Semiconductor Devices and ICs (ISPSD) - SiC MOSFET Corner and Statistical SPICE Model Generation
He, Canzhong, Victory, James, Xiao, Yunpeng, Vleeschouwer, Herbert De, Zheng, Elvis, Hu, ZhiPingYear:
2020
DOI:
10.1109/ISPSD46842.2020.9170091
File:
PDF, 1.24 MB
2020