Controlling Defect Formation of Nanoscale AlN: Toward...

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Advanced Electronic Materials 2020 / 08

Controlling Defect Formation of Nanoscale AlN: Toward Efficient Current Conduction of Ultrawide‐Bandgap Semiconductors

Wu, Yuanpeng, Laleyan, David A., Deng, Zihao, Ahn, Chihyo, Aiello, Anthony F., Pandey, Ayush, Liu, Xianhe, Wang, Ping, Sun, Kai, Ahmadi, Elaheh, Sun, Yi, Kira, Mackillo, Bhattacharya, Pallab K., Kioup
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Journal:
Advanced Electronic Materials
DOI:
10.1002/aelm.202000337
Date:
August, 2020
File:
PDF, 1011 KB
2020
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