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[IEEE 2020 IEEE/ASME International Conference on Advanced Intelligent Mechatronics (AIM) - Boston, MA, USA (2020.7.6-2020.7.9)] 2020 IEEE/ASME International Conference on Advanced Intelligent Mechatronics (AIM) - Defect detection based on singular value decomposition and histogram thresholding

Tran, Xuan Tuyen, Dinh, Tran Hiep, Le, Ha Vu, Zhu, Qiuchen, Ha, Quang
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Year:
2020
DOI:
10.1109/AIM43001.2020.9159005
File:
PDF, 4.65 MB
2020
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