Improved Defect Detection of Guided Wave Testing Using...

Sensors 2020 / 08 Vol. 20; Iss. 17

Improved Defect Detection of Guided Wave Testing Using Split-Spectrum Processing

Pedram, Seyed Kamran, Gan, Tat-Hean, Ghafourian, Mahdieh
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Volume:
20
Journal:
Sensors
DOI:
10.3390/s20174759
Date:
August, 2020
File:
PDF, 2.83 MB
2020
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