[IEEE 2020 IEEE VLSI Device Circuit and System (VLSI DCS) - Kolkata, India (2020.7.18-2020.7.19)] 2020 IEEE VLSI DEVICE CIRCUIT AND SYSTEM (VLSI DCS) - Effect of Body Thickness on Device Performance of Graded Channel Tri-Metal Double Gate Stack Gate TFET
Ghosh, Sudipta, Kundu, Supratim, Guha, Sourav, Ghosh, Jui, Pachal, Prithviraj, Sarkar, Subir KumarYear:
2020
DOI:
10.1109/VLSIDCS47293.2020.9179899
File:
PDF, 4.13 MB
2020