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[IEEE 2020 32nd International Symposium on Power Semiconductor Devices and ICs (ISPSD) - Vienna, Austria (2020.9.13-2020.9.18)] 2020 32nd International Symposium on Power Semiconductor Devices and ICs (ISPSD) - Short Circuit Robustness and Carrier Lifetime in Silicon Carbide MOSFETs
Kakarla, Bhagyalakshmi, Tsibizov, Alexander, Stark, Roger, Badstubner, Ivana Kovacevic, Grossner, UlrikeYear:
2020
DOI:
10.1109/ISPSD46842.2020.9170121
File:
PDF, 1.74 MB
2020